INTERACTING MULTIPLE MODEL
Experts
- Yaakov Bar-Shalom
- Henk A. P. Blom
- Stefan Becker
- Nathanael L. Baisa
- Michael Arens
- Hyun Myung
- Wolfgang Hübner
- Edwin A. Bloem
- Pengfei Li
- Yingmin Jia
- Hamidreza Amindavar
- En Fan
- Rong Yang
- Wenling Li
- Saeid R. Habibi
- Jingxiong Huang
- Lang Hong
- Hao Zhang
- Arye Nehorai
- Zhong Liu
- Fun-Bin Duh
- Li-Wei Fong
- Keli Hu
- Yong Yu
- R. Torelli
- Jongdae Jung
- Hui Ye
- Chung Choo Chung
- Rui Zhang
- Bing Hua
- Moongu Jeon
- Erik Meijering
- Éric Grivel
- Leonhard M. Reindl
- Walmir Matos Caminhas
- Futao Zhang
- Haibin Zhu
- Ronny Hug
- Yunhua Wu
Venues
- Sensors
- IEEE Access
- FUSION
- CoRR
- Signal Process.
- ACC
- CDC
- Digit. Signal Process.
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Signal Process.
- ICRA
- ICASSP
- IEEE Signal Process. Lett.
- IEEE Trans. Instrum. Meas.
- IROS
- ICIP
- Remote. Sens.
- FUZZ-IEEE
- IEEE Trans. Veh. Technol.
- SMC
- J. Frankl. Inst.
- ICPR (2)
- IET Signal Process.
- Multim. Tools Appl.
- Int. J. Syst. Sci.
- IGARSS
- ICCAIS
- IEEE Trans. Intell. Transp. Syst.
- IEEE Trans. Ind. Electron.
- ICIA
- Circuits Syst. Signal Process.
- IEEE Trans. Geosci. Remote. Sens.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- Int. J. Distributed Sens. Networks
- Autom.
- EURASIP J. Adv. Signal Process.
- IEEE Robotics Autom. Lett.
- MFI
- Eur. J. Control
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