INTERACTING MULTIPLE MODEL
Experts
- Henk A. P. Blom
- Yaakov Bar-Shalom
- Stefan Becker
- Hyun Myung
- Michael Arens
- Edwin A. Bloem
- Wolfgang Hübner
- Nathanael L. Baisa
- Wenling Li
- Rong Yang
- Hamidreza Amindavar
- Yingmin Jia
- Saeid R. Habibi
- En Fan
- Pengfei Li
- Antonio Graziano
- Gee Wah Ng
- Jin Bae Park
- Yu Liu
- Jun Liu
- Yunhua Wu
- Zhiming Chen
- R. Torelli
- Behzad Akbari
- Ziran Ding
- Ihor Smal
- Chi Chung Ko
- Bing Hua
- Hui Ye
- Mahendra Mallick
- Lingling Zhao
- Demetrios G. Lainiotis
- Sokratis K. Katsikas
- Hiroyuki Kawashima
- Hao Zhang
- Zhansheng Duan
- Jongdae Jung
- Guixi Liu
- Yang Zhang
Venues
- IEEE Access
- Sensors
- FUSION
- CoRR
- Signal Process.
- ACC
- CDC
- Digit. Signal Process.
- ICASSP
- IEEE Trans. Aerosp. Electron. Syst.
- IEEE Trans. Signal Process.
- ICRA
- IEEE Signal Process. Lett.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Veh. Technol.
- FUZZ-IEEE
- IROS
- SMC
- ICIP
- Remote. Sens.
- IEEE Trans. Intell. Transp. Syst.
- J. Frankl. Inst.
- IGARSS
- ICIA
- ICCAIS
- Int. J. Syst. Sci.
- ICPR (2)
- IET Signal Process.
- IEEE Trans. Ind. Electron.
- Multim. Tools Appl.
- IEEE Trans. Geosci. Remote. Sens.
- Circuits Syst. Signal Process.
- J. Softw.
- IEEE Geosci. Remote. Sens. Lett.
- MFI
- IEEE Trans. Autom. Control.
- Int. J. Distributed Sens. Networks
- Pattern Recognit.
- J. Intell. Robotic Syst.
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