Zhihong Mai

Publication Activity (10 Years)

Years Active: 2016-2021
Publications (10 Years): 11

Top Topics

Intravascular Ultrasound

Remote Sensing Images

Top Venues

Microelectron. Reliab.

Microelectron. J.

Publications

Zhihong Mai, Quanzhong Zhao, Zheng Liu, Weisheng Hou, Liang Zeng
An intelligent Cable Detection System in Shallow Water Area. AIAM (ACM) (2021)
Long Ma, Zhihong Mai, He Chen, Wenchao Liu, Fan Feng, Guichi Liu, Nouman Qadeer Soomro
Change Detection in Optical Remote Sensing Images with a Fully Object-Level Approach. IGARSS (2018)
Pik Kee Tan, Yuzhe Zhao, Francis Rivai, Binghai Liu, Yanlin Pan, Ran He, Hao Tan, Zhihong Mai
Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique. Microelectron. Reliab. (2018)
Shaalini Chithambaram, Pik Kee Tan, Yuzhe Zhao, Binghai Liu, Yinzhe Ma, Alfred Quah, Dayanand Nagalingam, Yanlin Pan, Zhihong Mai
Failure analysis on 14 nm FinFET devices with ESD CDM failure. Microelectron. Reliab. (2018)
Alfred C. T. Quah, Dayanand Nagalingam, Seung Je Moon, Edy Susanto, Ghim Boon Ang, Soh Ping Neo, Jeffrey Lam, Zhihong Mai
Static fault localization of subtle metallization defects using near infrared photon emission microscopy. Microelectron. Reliab. 73 (2017)
Soh Ping Neo, Alfred C. T. Quah, Ghim Boon Ang, Dayanand Nagalingam, Hnin Hnin Ma, Siong Luong Ting, C. W. Soo, Changqing Chen, Zhihong Mai, Jeffrey Lam
Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect. Microelectron. Reliab. (2017)
Changqing Chen, Ghim Boon Ang, Jeffrey Lam, Zhihong Mai
In-depth circuits edit analysis to reveal the implantation-related defect. Microelectron. J. 62 (2017)
Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Soh Ping Neo, Dayanand Nagalingam, Kim Hong Yip, Jeffery Lam, Zhihong Mai
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern. Microelectron. Reliab. (2017)
Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Hui Peng Ng, Alfred C. T. Quah, Angela Teo, Jeffery Lam, Zhihong Mai
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis. Microelectron. Reliab. (2017)
Yuzhe Zhao, Q. J. Wang, Pik Kee Tan, H. H. Yap, Binghai Liu, H. Feng, Hao Tan, Ran He, Y. M. Huang, D. D. Wang, L. Zhu, C. Q. Chen, Francis Rivai, Jeffery Lam, Zhihong Mai
Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system. Microelectron. Reliab. 64 (2016)
Changqing Chen, P. T. Ng, Ghinboon Ang, H. Tan, Francis Rivai, Y. Z. Ma, Huipeng Ng, Jeffrey Lam, Zhihong Mai
Electrical analysis on implantation-related defect by nanoprobing methodology. Microelectron. Reliab. 64 (2016)