Pik Kee Tan

Publication Activity (10 Years)

Years Active: 2015-2018
Publications (10 Years): 6

Top Topics

Fault Isolation

Structural Equation Modeling

Top Venues

Microelectron. Reliab.

Publications

Pik Kee Tan, Yuzhe Zhao, Francis Rivai, Binghai Liu, Yanlin Pan, Ran He, Hao Tan, Zhihong Mai
Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique. Microelectron. Reliab. (2018)
Shaalini Chithambaram, Pik Kee Tan, Yuzhe Zhao, Binghai Liu, Yinzhe Ma, Alfred Quah, Dayanand Nagalingam, Yanlin Pan, Zhihong Mai
Failure analysis on 14 nm FinFET devices with ESD CDM failure. Microelectron. Reliab. (2018)
Yi Chao Low, Pik Kee Tan, Soon Leng Tan, Yuzhe Zhao, Jeffrey Lam
Solving 28 nm I/O circuit reliability issue due to IC design weakness. Microelectron. Reliab. (2018)
Pik Kee Tan, Huei Hao Yap, Changqing Chen, Francis Rivai, Yu Zhe Zhao, L. Zhu, Hua Feng, Hao Tan, Ran He, D. D. Wang, Y. M. Huang, Yin Zhe Ma, Jeffery Lam, Zhi Hong Mai
Cross-sectional nanoprobing fault isolation technique on submicron devices. Microelectron. Reliab. 64 (2016)
Yuzhe Zhao, Q. J. Wang, Pik Kee Tan, H. H. Yap, Binghai Liu, H. Feng, Hao Tan, Ran He, Y. M. Huang, D. D. Wang, L. Zhu, C. Q. Chen, Francis Rivai, Jeffery Lam, Zhihong Mai
Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system. Microelectron. Reliab. 64 (2016)
H. H. Yap, Pik Kee Tan, L. Zhu, H. Feng, Y. Z. Zhao, Ran He, H. Tan, B. Liu, Y. M. Huang, D. D. Wang, Jeffery Lam, Z. H. Mai
Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue. Microelectron. Reliab. 64 (2016)
H. H. Yap, Pik Kee Tan, G. R. Low, M. K. Dawood, H. Feng, Y. Z. Zhao, Ran He, H. Tan, J. Zhu, B. Liu, Y. M. Huang, D. D. Wang, Jeffery Lam, Z. H. Mai
Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique. Microelectron. Reliab. 55 (9-10) (2015)