Dayanand Nagalingam

Publication Activity (10 Years)

Years Active: 2017-2018
Publications (10 Years): 4

Top Topics

Fault Localization

Pattern Discovery

Top Venues

Microelectron. Reliab.

Publications

Shaalini Chithambaram, Pik Kee Tan, Yuzhe Zhao, Binghai Liu, Yinzhe Ma, Alfred Quah, Dayanand Nagalingam, Yanlin Pan, Zhihong Mai
Failure analysis on 14 nm FinFET devices with ESD CDM failure. Microelectron. Reliab. (2018)
Alfred C. T. Quah, Dayanand Nagalingam, Seung Je Moon, Edy Susanto, Ghim Boon Ang, Soh Ping Neo, Jeffrey Lam, Zhihong Mai
Static fault localization of subtle metallization defects using near infrared photon emission microscopy. Microelectron. Reliab. 73 (2017)
Soh Ping Neo, Alfred C. T. Quah, Ghim Boon Ang, Dayanand Nagalingam, Hnin Hnin Ma, Siong Luong Ting, C. W. Soo, Changqing Chen, Zhihong Mai, Jeffrey Lam
Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect. Microelectron. Reliab. (2017)
Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Soh Ping Neo, Dayanand Nagalingam, Kim Hong Yip, Jeffery Lam, Zhihong Mai
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern. Microelectron. Reliab. (2017)