Ghim Boon Ang

Publication Activity (10 Years)

Years Active: 2017-2017
Publications (10 Years): 5

Top Topics

Integrated Circuit

Pattern Discovery

Fault Localization

Top Venues

Microelectron. Reliab.

Microelectron. J.

Publications

Alfred C. T. Quah, Dayanand Nagalingam, Seung Je Moon, Edy Susanto, Ghim Boon Ang, Soh Ping Neo, Jeffrey Lam, Zhihong Mai
Static fault localization of subtle metallization defects using near infrared photon emission microscopy. Microelectron. Reliab. 73 (2017)
Soh Ping Neo, Alfred C. T. Quah, Ghim Boon Ang, Dayanand Nagalingam, Hnin Hnin Ma, Siong Luong Ting, C. W. Soo, Changqing Chen, Zhihong Mai, Jeffrey Lam
Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect. Microelectron. Reliab. (2017)
Changqing Chen, Ghim Boon Ang, Jeffrey Lam, Zhihong Mai
In-depth circuits edit analysis to reveal the implantation-related defect. Microelectron. J. 62 (2017)
Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Soh Ping Neo, Dayanand Nagalingam, Kim Hong Yip, Jeffery Lam, Zhihong Mai
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern. Microelectron. Reliab. (2017)
Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Hui Peng Ng, Alfred C. T. Quah, Angela Teo, Jeffery Lam, Zhihong Mai
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis. Microelectron. Reliab. (2017)