Jeffrey Lam

Publication Activity (10 Years)

Years Active: 2016-2018
Publications (10 Years): 6

Top Topics

Software Testing

Program Slicing

Fault Localization

Top Venues

Microelectron. Reliab.

Microelectron. J.

Publications

Yi Chao Low, Pik Kee Tan, Soon Leng Tan, Yuzhe Zhao, Jeffrey Lam
Solving 28 nm I/O circuit reliability issue due to IC design weakness. Microelectron. Reliab. (2018)
Alfred C. T. Quah, Dayanand Nagalingam, Seung Je Moon, Edy Susanto, Ghim Boon Ang, Soh Ping Neo, Jeffrey Lam, Zhihong Mai
Static fault localization of subtle metallization defects using near infrared photon emission microscopy. Microelectron. Reliab. 73 (2017)
Soh Ping Neo, Alfred C. T. Quah, Ghim Boon Ang, Dayanand Nagalingam, Hnin Hnin Ma, Siong Luong Ting, C. W. Soo, Changqing Chen, Zhihong Mai, Jeffrey Lam
Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect. Microelectron. Reliab. (2017)
Changqing Chen, Ghim Boon Ang, Jeffrey Lam, Zhihong Mai
In-depth circuits edit analysis to reveal the implantation-related defect. Microelectron. J. 62 (2017)
S. H. Goh, Y. H. Chan, Zhao Lin, Jeffrey Lam
Concurrent built-in self-testing under the constraint of shared test resources and its test time reduction. Integr. 59 (2017)
Changqing Chen, P. T. Ng, Ghinboon Ang, H. Tan, Francis Rivai, Y. Z. Ma, Huipeng Ng, Jeffrey Lam, Zhihong Mai
Electrical analysis on implantation-related defect by nanoprobing methodology. Microelectron. Reliab. 64 (2016)