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Solving 28 nm I/O circuit reliability issue due to IC design weakness.

Yi Chao LowPik Kee TanSoon Leng TanYuzhe ZhaoJeffrey Lam
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • circuit design
  • neural network
  • user interface
  • design process
  • case study
  • cmos technology
  • high speed
  • building blocks
  • software architecture
  • chip design