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Yi Chao Low
ORCID
Publication Activity (10 Years)
Years Active: 2018-2018
Publications (10 Years): 1
Top Topics
Case Study
Chip Design
Building Blocks
User Interface
Top Venues
Microelectron. Reliab.
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Publications
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Yi Chao Low
,
Pik Kee Tan
,
Soon Leng Tan
,
Yuzhe Zhao
,
Jeffrey Lam
Solving 28 nm I/O circuit reliability issue due to IC design weakness.
Microelectron. Reliab.
(2018)