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Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect.

Soh Ping NeoAlfred C. T. QuahGhim Boon AngDayanand NagalingamHnin Hnin MaSiong Luong TingC. W. SooChangqing ChenZhihong MaiJeffrey Lam
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • failure detection
  • databases
  • genetic algorithm
  • artificial neural networks
  • image analysis
  • evolutionary algorithm
  • feature selection
  • case study
  • statistical analysis
  • design methodology
  • analysis tool
  • root cause