Login / Signup

Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis.

Changqing ChenGhim Boon AngPeng Tiong NgFrancis RivaiHui Peng NgAlfred C. T. QuahAngela TeoJeffery LamZhihong Mai
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • image analysis
  • decision making
  • quantitative analysis
  • neural network
  • artificial intelligence
  • bayesian networks
  • data analysis
  • management system