M. K. Dawood

Publication Activity (10 Years)

Years Active: 2015-2015
Publications (10 Years): 1

Top Topics

Visual Inspection

Top Venues

Microelectron. Reliab.

Publications

H. H. Yap, Pik Kee Tan, G. R. Low, M. K. Dawood, H. Feng, Y. Z. Zhao, Ran He, H. Tan, J. Zhu, B. Liu, Y. M. Huang, D. D. Wang, Jeffery Lam, Z. H. Mai
Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique. Microelectron. Reliab. 55 (9-10) (2015)