Valeria Kilchytska

Publication Activity (10 Years)

Years Active: 2007-2017
Publications (10 Years): 2

Top Topics

High Temperature

Ultra Low Power

Top Venues

Microelectron. Reliab.

Publications

B. Kazemi Esfeh, Valeria Kilchytska, Bertrand Parvais, Nicolas Planes, M. Haond, Denis Flandre, Jean-Pierre Raskin
Back-gate bias effect on UTBB-FDSOI non-linearity performance. ESSDERC (2017)
K. Ben Ali, P. M. Gammon, C. W. Chan, F. Li, V. Pathirana, T. Trajkovic, Farzan Gity, Denis Flandre, Valeria Kilchytska
Single event effects and total ionising dose in 600V Si-on-SiC LDMOS transistors for rad-hard space applications. ESSDERC (2017)
Sergej Makovejev, B. Kazemi Esfeh, Jean-Pierre Raskin, Valeria Kilchytska, Denis Flandre, V. Barral, Nicolas Planes, M. Haond
Variability of UTBB MOSFET analog figures of merit in wide frequency range. ESSDERC (2014)
El Hafed Boufouss, Laurent A. Francis, Valeria Kilchytska, Pierre Gérard, Pascal Simon, Denis Flandre
Ultra-Low Power High Temperature and Radiation Hard Complementary Metal-Oxide-Semiconductor (CMOS) Silicon-on-Insulator (SOI) Voltage Reference. Sensors 13 (12) (2013)
Sergej Makovejev, Babak Kazemi Esfeh, Jean-Pierre Raskin, Denis Flandre, Valeria Kilchytska, François Andrieu
Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets. ESSDERC (2013)
Valeria Kilchytska, Denis Flandre, François Andrieu
On the UTBB SOI MOSFET performance improvement in quasi-double-gate regime. ESSDERC (2012)
Valeria Kilchytska, Joaquín Alvarado, S. Put, Nadine Collaert, Eddy Simoen, Cor Claeys, Otilia Militaru, Guy Berger, Denis Flandre
High-energy neutrons effect on strained and non-strained SOI MuGFETs and planar MOSFETs. Microelectron. Reliab. 52 (1) (2012)
C. Roda Neve, Valeria Kilchytska, Joaquín Alvarado, Dimitri Lederer, O. Militaru, Denis Flandre, Jean-Pierre Raskin
Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer. Microelectron. Reliab. 51 (2) (2011)
Joaquín Alvarado, Valeria Kilchytska, El Hafed Boufouss, Denis Flandre
Characterization and modelling of single event transients in LDMOS-SOI FETs. Microelectron. Reliab. 51 (9-11) (2011)
Joaquín Alvarado, El Hafed Boufouss, Valeria Kilchytska, Denis Flandre
Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs. Microelectron. Reliab. 50 (9-11) (2010)
Joaquín Alvarado, Antonio Cerdeira, Valeria Kilchytska, Denis Flandre
Harmonic distortion analysis using an improved charge sheet model for PD SOI MOSFETs. Microelectron. J. 38 (3) (2007)