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Single event effects and total ionising dose in 600V Si-on-SiC LDMOS transistors for rad-hard space applications.

K. Ben AliP. M. GammonC. W. ChanF. LiV. PathiranaT. TrajkovicFarzan GityDenis FlandreValeria Kilchytska
Published in: ESSDERC (2017)
Keyphrases
  • low dimensional
  • space time
  • database
  • real time
  • neural network
  • image sequences
  • event detection