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Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs.
Joaquín Alvarado
El Hafed Boufouss
Valeria Kilchytska
Denis Flandre
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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probabilistic model
statistical model
wide range
theoretical analysis
computational model
neural network
learning algorithm
management system
mathematical model
experimental data
multi channel
objective function
theoretical framework