Sheng-Kai Fan

Publication Activity (10 Years)

Years Active: 2013-2020
Publications (10 Years): 10

Top Topics

Scanning Devices

Chemical Vapor Deposition

Top Venues

Publications

Sheng-Kai Fan, Shen-Li Chen, Po-Lin Lin, Shi-Zhe Hong, Tien-Yu Lan, Yu-Jie Zhou
A Novel SCR-based Schottky Diode and Lightly P-well Additions of HV 60V nLDMOS on ESD Capability. ICCE-TW (2020)
Shi-Zhe Hong, Shen-Li Chen, Sheng-Kai Fan, Po-Lin Lin, Tien-Yu Lan, Yu-Jie Zhou
Strengthened ESD Reliability of HV nLDMOSs with Embedded Horizontal Schottky Devices. ICKII (2020)
Tien-Yu Lan, Shen-Li Chen, Po-Lin Lin, Sheng-Kai Fan, Yu-Jie Zhou, Shi-Zhe Hong, Hung-Wei Chen
ESD-ability of Circular nLDMOS Transistors of UHV by Super-junction Length Modulation and Concentration Gradient. ICKII (2020)
Tien-Yu Lan, Shen-Li Chen, Sheng-Kai Fan, Po-Lin Lin, Yu-Jie Zhou, Shi-Zhe Hong, Hung-Wei Chen
ESD-capability Influences of UHV Circular nLDMOS Transistors by the Drain-side Ladder-step STI. ICCE-TW (2020)
Yu-Jie Zhou, Shen-Li Chen, Pei-Lin Wu, Po-Lin Lin, Sheng-Kai Fan, Tien-Yu Lan, Shi-Zhe Hong
ESD-capability Enhancement of Ultra-high Voltage nLDMOSs by the DPW Discrete Layer. ICKII (2020)
Po-Lin Lin, Shen-Li Chen, Sheng-Kai Fan, Tien-Yu Lan, Yu-Jie Zhou, Shi-Zhe Hong
Improving the ESD Robustness of an Ultra-high Voltage nLDMOS Device with the Embedded Schottky Diode. ICCE-TW (2020)
Po-Lin Lin, Shen-Li Chen, Pei-Lin Wu, Yu-Lin Jhou, Sheng-Kai Fan
Evaluating the Drift-Region Length Effect of nLDMOS on ESD Ability with a TLP Testing System. GCCE (2019)
Sheng-Kai Fan, Shen-Li Chen, Yu-Lin Jhou, Pei-Lin Wu, Po-Lin Lin
Channel- & Drift Region's STI-Lengths Impacts of ESD Immunity in HV 60 V nLDMOS Devices. ICCE-TW (2019)
Sheng-Kai Fan, Shen-Li Chen, Yu-Lin Jhou, Pei-Lin Wu, Po-Lin Lin
ESD Immunity Impacts of the Drain-Side Heterojunction Device Addition in HV 60 V n/pLDMOS Devices. GCCE (2019)
Po-Lin Lin, Shen-Li Chen, Pei-Lin Wu, Yu-Lin Jhou, Sheng-Kai Fan
of an UHV Elliptical LDMOS-SCR by the Drain-Side Junction Replacement. ICCE-TW (2019)
Yih-Shing Lee, Sheng-Kai Fan, Chii-Wen Chen, Tung-Wei Yen, Horng-Chih Lin
Temperature instability of amorphous In-Ga-Zn-O thin film transistors. ICAIT (2013)