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Evaluating the Drift-Region Length Effect of nLDMOS on ESD Ability with a TLP Testing System.

Po-Lin LinShen-Li ChenPei-Lin WuYu-Lin JhouSheng-Kai Fan
Published in: GCCE (2019)
Keyphrases
  • expert systems
  • multi agent
  • region of interest
  • artificial intelligence
  • case study
  • test data
  • image structure
  • maximum number
  • software testing
  • fixed length
  • explanatory power