Login / Signup

Strengthened ESD Reliability of HV nLDMOSs with Embedded Horizontal Schottky Devices.

Shi-Zhe HongShen-Li ChenSheng-Kai FanPo-Lin LinTien-Yu LanYu-Jie Zhou
Published in: ICKII (2020)
Keyphrases
  • embedded systems
  • everyday objects
  • mobile devices
  • embedded devices
  • high density
  • artificial intelligence
  • processing capabilities
  • reliability analysis
  • image processing
  • case study
  • mobile applications