Robbert van Herpen

Publication Activity (10 Years)

Years Active: 2009-2016
Publications (10 Years): 1

Top Topics

Facial Asymmetry

Frequency Domain Analysis

Affine Invariance

Top Venues

IEEE Trans. Control. Syst. Technol.

IEEE Trans. Autom. Control.

Publications

Robbert van Herpen, Okko H. Bosgra, Tom Oomen
Bi-Orthonormal Polynomial Basis Function Framework With Applications in System Identification. IEEE Trans. Autom. Control. 61 (11) (2016)
Tom Oomen, Robbert van Herpen, Sander Quist, Marc M. J. van de Wal, Okko H. Bosgra, Maarten Steinbuch
Connecting System Identification and Robust Control for Next-Generation Motion Control of a Wafer Stage. IEEE Trans. Control. Syst. Technol. 22 (1) (2014)
Robbert van Herpen, Tom Oomen, Maarten Steinbuch
Optimally conditioned instrumental variable approach for frequency-domain system identification. Autom. 50 (9) (2014)
Robbert van Herpen, Tom Oomen, Edward Kikken, Marc M. J. van de Wal, Wouter H. T. M. Aangenent, Maarten Steinbuch
Exploiting additional actuators and sensors for nano-positioning robust motion control. ACC (2014)
Frank Boeren, Robbert van Herpen, Tom Oomen, Marc M. J. van de Wal, Okko H. Bosgra
Enhancing performance through multivariable weighting function design in ℋ- loop-shaping: with application to a motion system. ACC (2013)
Robbert van Herpen, Tom Oomen, Okko H. Bosgra
Bi-orthonormal basis functions for improved frequency-domain system identification. CDC (2012)
Tom Oomen, Robbert van Herpen, Sander Quist, Marc M. J. van de Wal, Okko H. Bosgra, Maarten Steinbuch
Next-generation wafer stage motion control: Connecting system identification and robust control. ACC (2012)
Robbert van Herpen, Tom Oomen, Okko H. Bosgra
A robust-control-relevant perspective on model order selection. ACC (2011)
Tom Oomen, Erik Grassens, Ferdinand Hendriks, Robbert van Herpen, Okko H. Bosgra
Inferential motion control: Identification and robust control with unmeasured performance variables. CDC/ECC (2011)
Robbert van Herpen, Tom Oomen, Marc M. J. van de Wal, Okko H. Bosgra
Experimental evaluation of robust-control-relevance: A confrontation with a next-generation wafer stage. ACC (2010)
Tom Oomen, Sander Quist, Robbert van Herpen, Okko H. Bosgra
Identification and visualization of robust-control-relevant model sets with application to an industrial wafer stage. CDC (2010)
Markus Koitka, Olaf Kahrs, Robbert van Herpen, Veit Hagenmeyer
SISO-Closed-Loop Identifikation: Eine Toolbox für den Einsatz in der industriellen Praxis (SISO-Closed-Loop Identification: A Toolbox Ready-to-Use in Industrial Practice). Autom. 57 (4) (2009)