FACIAL ASYMMETRY
Experts
- Fumiyuki Adachi
- Marios Savvides
- Sinjini Mitra
- Johan Schoukens
- Rik Pintelon
- Liang Wang
- Kazuki Takeda
- Rui Dinis
- Mark S. Nixon
- Tom Oomen
- B. V. K. Vijaya Kumar
- Hüseyin Akçay
- Maarten Steinbuch
- Josef Pieprzyk
- Yanxi Liu
- Hassan Jameel Asghar
- Tetsuya Yamamoto
- Shujun Li
- Jeffrey F. Cohn
- Chang Xu
- Sven Behnke
- Arnold H. Buss
- Sajid Saleem
- Sheldon H. Jacobson
- Yunhe Wang
- Anil K. Jain
- Ioannis Pitas
- Marc Moonen
- Walter Kellermann
- Hafez Farazi
- Rama Chellappa
- Paulo Montezuma
- Miaowen Wen
- Bufu Huang
- Dusan Agrez
- André Bourdoux
- Yasser Ismail
- Zhiwen Yu
- Dariusz Frejlichowski
Venues
- CoRR
- ICASSP
- Autom.
- IEEE Trans. Instrum. Meas.
- CDC
- Sensors
- IEICE Trans. Commun.
- ISCAS
- IEEE Access
- EUSIPCO
- IEEE Trans. Autom. Control.
- Pattern Recognit.
- IEEE Trans. Wirel. Commun.
- IEEE Trans. Signal Process.
- IEEE Commun. Lett.
- VTC Spring
- PIMRC
- VTC Fall
- ICC
- Multim. Tools Appl.
- IEEE Trans. Commun.
- EMBC
- WCNC
- IEEE Signal Process. Lett.
- OFC
- ECC
- WSC
- Signal Process.
- ICIP
- ACC
- IEEE Trans. Control. Syst. Technol.
- Symmetry
- IEEE Trans. Geosci. Remote. Sens.
- INTERSPEECH
- IEEE Geosci. Remote. Sens. Lett.
- IEEE Trans. Veh. Technol.
- Remote. Sens.
- CVPR Workshops
- IEEE Trans. Speech Audio Process.
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