Identification and visualization of robust-control-relevant model sets with application to an industrial wafer stage.
Tom OomenSander QuistRobbert van HerpenOkko H. BosgraPublished in: CDC (2010)
Keyphrases
- control strategies
- probabilistic model
- mathematical model
- neural network
- control structure
- formal model
- computational model
- theoretical framework
- parameter identification
- data sets
- industrial applications
- neural network model
- experimental data
- process model
- self organizing maps
- mobile robot
- data analysis
- bayesian networks
- search engine
- data mining