Mu-Chun Wang

Publication Activity (10 Years)

Years Active: 2005-2022
Publications (10 Years): 11

Top Topics

Leakage Current

Recommender Systems

Top Venues

Microelectron. Reliab.

Publications

Shuo Zhang, Mu-Chun Wang, Krisztian Balog
Analyzing and Simulating User Utterance Reformulation in Conversational Recommender Systems. SIGIR (2022)
Shuo Zhang, Mu-Chun Wang, Krisztian Balog
Analyzing and Simulating User Utterance Reformulation in Conversational Recommender Systems. CoRR (2022)
Mu-Chun Wang, Zixuan Liu, Sheng Wang
Textomics: A Dataset for Genomics Data Summary Generation. ACL (1) (2022)
Weibo Gao, Qi Liu, Zhenya Huang, Yu Yin, Haoyang Bi, Mu-Chun Wang, Jianhui Ma, Shijin Wang, Yu Su
RCD: Relation Map Driven Cognitive Diagnosis for Intelligent Education Systems. SIGIR (2021)
De-Cheng Zhang, Ching-Chuan Chou, Ho-Hsiang Chen, Shang-Ze Chen, Jian-Ming Chen, Hui-Yun Bor, Wen-How Lan, Mu-Chun Wang
Fringe Gate Leakage of 28nm HK/MG nMOSFETs with Nitridation Treatments. ICKII (2020)
Ying-Jun Deng, Hao-Lun Hu, Yu-Han Liang, Jian-Ming Chen, Ching-Chuan Chou, Shea-Jue Wang, Mu-Chun Wang
Q-factor Integrity of 28nm-node High-k Gate Dielectric. ICKII (2020)
Si-Ping Li, Jia-Wei Xu, Wei-Hao Li, Jian-Ming Chen, Chao-Nan Wei, Wen-How Lan, Mu-Chun Wang
Patterns of Exposing Integrity of 28nm-node High-k Gate Dielectric on p-substrate with Nitridation Treatments. ICKII (2020)
Yu-Chen Lin, Kai-Chun Zhan, Ji-Min Zhang, Jian-Ming Chen, Cheng-Hsun-Tony Chang, Shea-Jue Wang, Mu-Chun Wang
Junction Integrity for 28nm High-k nMOSFETs with Thermal Stress. ICKII (2020)
Fu-Yuan Tuan, Chii-Wen Chen, Mu-Chun Wang, Wen-Shiang Liao, Shea-Jue Wang, Shou-Kong Fan, Wen-How Lan
Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. Microelectron. Reliab. 83 (2018)
Shea-Jue Wang, Mu-Chun Wang, Shih-Fan Chen, Yu-Hsiang Li, Tien-Szu Shen, Hui-Yun Bor, Chao-Nan Wei
Sandwich Structure Fabricated with Magnetic-Control Sputtering Metrology †. Sensors 18 (9) (2018)
Shea-Jue Wang, Mu-Chun Wang, Shuang-Yuan Chen, Wen-How Lan, Bor-Wen Yang, L. S. Huang, Chuan-Hsi Liu
Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment. Microelectron. Reliab. 55 (11) (2015)
Mu-Chun Wang, Chuan-Hsi Liu, Kuo-Shu Huang, Zhen-Ying Hsieh, Shuang-Yuan Chen, Hsin-Chia Yang, Chii-Ruey Lin
Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process. Microelectron. Reliab. 50 (6) (2010)
Zhen-Ying Hsieh, Mu-Chun Wang, Chih Chen, Jia-Min Shieh, Yu-Ting Lin, Shuang-Yuan Chen, Heng-Sheng Huang
Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs. Microelectron. Reliab. 49 (8) (2009)
Tsung-Hsiang Chang, Chien-Ju Ho, David Chawei Hsu, Yuan-Hsiang Lee, Min-Shieh Tsai, Mu-Chun Wang, Jane Yung-jen Hsu
- A Partner for the Visually Impaired. EUC Workshops (2005)