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Thermal stress probing the channel-length modulation effect of nano n-type FinFETs.

Fu-Yuan TuanChii-Wen ChenMu-Chun WangWen-Shiang LiaoShea-Jue WangShou-Kong FanWen-How Lan
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • multi channel
  • ofdm system
  • single channel
  • received signal
  • amplitude modulation
  • nano scale