Wen-How Lan

Publication Activity (10 Years)

Years Active: 2015-2020
Publications (10 Years): 4

Top Topics

Atomic Force Microscopy

Electrical Properties

Medical Treatment

Leakage Current

Top Venues

Microelectron. Reliab.

Publications

De-Cheng Zhang, Ching-Chuan Chou, Ho-Hsiang Chen, Shang-Ze Chen, Jian-Ming Chen, Hui-Yun Bor, Wen-How Lan, Mu-Chun Wang
Fringe Gate Leakage of 28nm HK/MG nMOSFETs with Nitridation Treatments. ICKII (2020)
Si-Ping Li, Jia-Wei Xu, Wei-Hao Li, Jian-Ming Chen, Chao-Nan Wei, Wen-How Lan, Mu-Chun Wang
Patterns of Exposing Integrity of 28nm-node High-k Gate Dielectric on p-substrate with Nitridation Treatments. ICKII (2020)
Fu-Yuan Tuan, Chii-Wen Chen, Mu-Chun Wang, Wen-Shiang Liao, Shea-Jue Wang, Shou-Kong Fan, Wen-How Lan
Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. Microelectron. Reliab. 83 (2018)
Shea-Jue Wang, Mu-Chun Wang, Shuang-Yuan Chen, Wen-How Lan, Bor-Wen Yang, L. S. Huang, Chuan-Hsi Liu
Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment. Microelectron. Reliab. 55 (11) (2015)