Login / Signup

Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs.

Zhen-Ying HsiehMu-Chun WangChih ChenJia-Min ShiehYu-Ting LinShuang-Yuan ChenHeng-Sheng Huang
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • early warning
  • thin film
  • neural network
  • decision making
  • digital libraries
  • relational databases
  • multiresolution
  • decision support system