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M. I. Vexler
ORCID
Publication Activity (10 Years)
Years Active: 2001-2020
Publications (10 Years): 1
Top Topics
Mechanical Properties
Preprocessing
Atomic Force Microscopy
High Temperature
Top Venues
DRC
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Publications
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Yury Yu. Illarionov
,
A. G. Banshchikov
,
Theresia Knobloch
,
Dmitry K. Polyushkin
,
S. Wachter
,
V. V. Fedorov
,
S. M. Suturin
,
M. Stöger-Pollach
,
Thomas Mueller
,
M. I. Vexler
,
N. S. Sokolov
,
Tibor Grasser
Crystalline Calcium Fluoride: A Record-Thin Insulator for Nanoscale 2D Electronics.
DRC
(2020)
I. V. Grekhov
,
G. G. Kareva
,
S. E. Tyaginov
,
M. I. Vexler
Application of an MOS tunnel transistor for measurements of the tunneling parameters and of the parameters of electron energy relaxation in silicon.
Microelectron. Reliab.
47 (4-5) (2007)
S. E. Tyaginov
,
M. I. Vexler
,
A. F. Shulekin
,
I. V. Grekhov
The post-damage behavior of a MOS tunnel emitter transistor.
Microelectron. Reliab.
46 (7) (2006)
M. I. Vexler
,
A. El Hdiy
,
D. Grgec
,
S. E. Tyaginov
,
R. Khlil
,
Bernd Meinerzhagen
,
A. F. Shulekin
,
I. V. Grekhov
Tunnel charge transport within silicon in reversely-biased MOS tunnel structures.
Microelectron. J.
37 (2) (2006)
R. Khlil
,
A. El Hdiy
,
A. F. Shulekin
,
S. E. Tyaginov
,
M. I. Vexler
Soft breakdown of MOS tunnel diodes with a spatially non-uniform oxide thickness.
Microelectron. Reliab.
44 (3) (2004)
N. Asli
,
M. I. Vexler
,
A. F. Shulekin
,
P. Douglas Yoder
,
I. V. Grekhov
,
P. Seegebrecht
Threshold energies in the light emission characteristics of silicon MOS tunnel diodes.
Microelectron. Reliab.
41 (7) (2001)