Login / Signup
Soft breakdown of MOS tunnel diodes with a spatially non-uniform oxide thickness.
R. Khlil
A. El Hdiy
A. F. Shulekin
S. E. Tyaginov
M. I. Vexler
Published in:
Microelectron. Reliab. (2004)
Keyphrases
</>
room temperature
film thickness
leakage current
thin film
high speed
light scattering
high density
cross section
si sio
neural network
fuel cell
cortical thickness
simulation model
cost function
three dimensional
decision trees
information retrieval
real world