P. Seegebrecht

Publication Activity (10 Years)

Years Active: 2001-2001
Publications (10 Years): 0

Publications

Jan-Werner Zahlmann-Nowitzki, L. Nebrich, P. Seegebrecht
On the influence of the variation of measurement conditions on the FNT characteristics of stressed thin silicon oxides. Microelectron. Reliab. 41 (7) (2001)
N. Asli, M. I. Vexler, A. F. Shulekin, P. Douglas Yoder, I. V. Grekhov, P. Seegebrecht
Threshold energies in the light emission characteristics of silicon MOS tunnel diodes. Microelectron. Reliab. 41 (7) (2001)