Liviu Militaru

Publication Activity (10 Years)

Years Active: 2001-2022
Publications (10 Years): 4

Top Topics

Computer Aided Design

Graceful Degradation

Silicon Dioxide

Top Venues

Microelectron. J.

Microelectron. Reliab.

Publications

C. Laguna, Mathieu Bernard, Julien Garrione, Niccolo Castellani, Valentina Meli, S. Martin, François Aussenac, D. Rouchon, N. Rochat, Emmanuel Nolot, Guillaume Bourgeois, Marie Claire Cyrille, Liviu Militaru, A. Souifi, François Andrieu, Gabriele Navarro
Multilayer Structure in SeAsGeSi-based OTS for High Thermal Stability and Reliability Enhancement. ESSDERC (2022)
C. Laguna, Mathieu Bernard, Nicolas Bernier, D. Rouchon, N. Rochat, Julien Garrione, A. Jannaud, Emmanuel Nolot, V. Meli, Niccolo Castellani, C. Sabbione, Guillaume Bourgeois, Marie Claire Cyrille, Liviu Militaru, A. Souifi, Gabriele Navarro, Etienne Nowak
Multilayer OTS Selectors Engineering for High Temperature Stability, Scalability and High Endurance. IMW (2021)
Slah Hlali, Neila Hizem, Liviu Militaru, A. Kalboussi, Abdelkader Souifi
Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics. Microelectron. Reliab. 75 (2017)
Inga Zbierska, Liviu Militaru, Françis Calmon, Sylvain Feruglio, Guo-Neng Lu
Electrical characterization and TCAD simulations of multi-gate bulk nMOSFET. Microelectron. J. 46 (7) (2015)
W. Hourani, B. Gautier, Liviu Militaru, D. Albertini, A. Descamps-Mandine, R. Arinero
Influence of the surrounding ambient on the reliability of the electrical characterization of thin oxide layers using an atomic force microscope. Microelectron. Reliab. 51 (12) (2011)
T. Nguyen, C. Busseret, Liviu Militaru, A. Poncet, D. Aimé, Nicolas Baboux, Carole Plossu
Parameters extraction of hafnium based gate oxide capacitors. Microelectron. Reliab. 47 (4-5) (2007)
Nabil Sghaier, Liviu Militaru, M'Hamed Trabelsi, Yacoubi Yacoubi, Souifi Souifi
Analysis of slow traps centres in submicron MOSFETs by random telegraph signal technique. Microelectron. J. 38 (4-5) (2007)
Nabil Sghaier, M'Hamed Trabelsi, Ne. Sghaier, Liviu Militaru, Abdelkader Souifi, Adel Kalboussi, Noureddine Yacoubi
Static and low-frequency noise characterization in submicron MOSFETs for memories cells applications. Microelectron. J. 37 (11) (2006)
Liviu Militaru, A. Souifi, M. Mouis, Alain Chantre, G. Brémond
Investigation of deep traps in silicon-germanium epitaxial base bipolar transistors with a single polysilicon quasi self-aligned architecture. Microelectron. Reliab. 41 (2) (2001)