Static and low-frequency noise characterization in submicron MOSFETs for memories cells applications.
Nabil SghaierM'Hamed TrabelsiNe. SghaierLiviu MilitaruAbdelkader SouifiAdel KalboussiNoureddine YacoubiPublished in: Microelectron. J. (2006)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- subband
- low pass
- wavelet coefficients
- discrete wavelet transform
- wavelet analysis
- frequency band
- electromagnetic fields
- vlsi circuits
- original images
- high resolution
- low and high frequency
- high frequency components
- visual quality
- dct domain
- dct coefficients
- low power
- contourlet transform
- image reconstruction
- denoising
- image compression
- bit rate