Kuei-Shu Chang-Liao

Publication Activity (10 Years)

Years Active: 2007-2022
Publications (10 Years): 4

Top Topics

Electrical Properties

Silicon Dioxide

Schottky Barrier

Top Venues

Microelectron. Reliab.

Publications

Pradhana Jati Budhi Laksana, Li-Chu Tsai, Chang-Cheng Lin, Kuei-Shu Chang-Liao, Mathew K. Moodley, Chii-Dong Chen
Opto Field-Effect Transistors for Detecting Quercetin-Cu2+ Complex. Sensors 22 (19) (2022)
Hsin-Kai Fang, Kuei-Shu Chang-Liao, Chia-Hsin Cheng, Po-Yao Lin, Wen-Hsien Huang, Chang-Hong Shen, Jia-Min Shieh
trapping layers formed with low temperature processes on gate-all-around junctionless charge-trapping flash memory devices. Microelectron. Reliab. 91 (2018)
Chan-Ching Lin, Kuei-Shu Chang-Liao, Tzung-Bin Huang, Cheng-Jung Yu, Hsueh-Chao Ko
A new erase method for scaled NAND flash memory device. Microelectron. Reliab. 72 (2017)
Yan-Lin Li, Kuei-Shu Chang-Liao, Yu-Wei Chang, Tse-Jung Huang, Chen-Chien Li, Zhao-Chen Gu, Po-Yen Chen, Tzung-Yu Wu, Jiayi Huang, Fu-Chuan Chu, Shih-Han Yi
Improved reliability characteristics of Ge MOS devices by capping Hf or Zr on interfacial layer. Microelectron. Reliab. 79 (2017)
Hao-Chieh Lee, Kuei-Shu Chang-Liao, Yan-Lin Li
. Microelectron. Reliab. 55 (11) (2015)
Wei-Fong Chi, Kuei-Shu Chang-Liao, Shih-Han Yi, Chen-Chien Li, Yan-Lin Li
Gate leakage current suppression and reliability improvement for ultra-low EOT Ge MOS devices by suitable HfAlO/HfON thickness and sintering temperature. Microelectron. Reliab. 55 (11) (2015)
Chun-Chang Lu, Kuei-Shu Chang-Liao, Chun-Yuan Lu, Shih-Cheng Chang, Tien-Ko Wang, Fu-Chung Hou, Yao-Tung Hsu
Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs. Microelectron. Reliab. 51 (12) (2011)
Chia-Huai Ho, Kuei-Shu Chang-Liao, Chun-Yuan Lu, Chun-Chang Lu, Tien-Ko Wang
Employing vertical dielectric layers to improve the operation performance of flash memory devices. Microelectron. Reliab. 49 (4) (2009)
Chia-Huai Ho, Kuei-Shu Chang-Liao, Ya-Nan Huang, Tien-Ko Wang, T. C. Lu
Performance and reliability improvement of flash device by a novel programming method. Microelectron. Reliab. 47 (6) (2007)