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A new erase method for scaled NAND flash memory device.

Chan-Ching LinKuei-Shu Chang-LiaoTzung-Bin HuangCheng-Jung YuHsueh-Chao Ko
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • flash memory
  • data sets
  • data structure
  • embedded systems
  • solid state
  • case study
  • random access