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Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs.

Chun-Chang LuKuei-Shu Chang-LiaoChun-Yuan LuShih-Cheng ChangTien-Ko WangFu-Chung HouYao-Tung Hsu
Published in: Microelectron. Reliab. (2011)
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