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Shih-Han Yi
Publication Activity (10 Years)
Years Active: 2015-2017
Publications (10 Years): 2
Top Topics
Mobile Devices
Film Thickness
Silicon Dioxide
Improved Algorithm
Top Venues
Microelectron. Reliab.
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Publications
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Yan-Lin Li
,
Kuei-Shu Chang-Liao
,
Yu-Wei Chang
,
Tse-Jung Huang
,
Chen-Chien Li
,
Zhao-Chen Gu
,
Po-Yen Chen
,
Tzung-Yu Wu
,
Jiayi Huang
,
Fu-Chuan Chu
,
Shih-Han Yi
Improved reliability characteristics of Ge MOS devices by capping Hf or Zr on interfacial layer.
Microelectron. Reliab.
79 (2017)
Wei-Fong Chi
,
Kuei-Shu Chang-Liao
,
Shih-Han Yi
,
Chen-Chien Li
,
Yan-Lin Li
Gate leakage current suppression and reliability improvement for ultra-low EOT Ge MOS devices by suitable HfAlO/HfON thickness and sintering temperature.
Microelectron. Reliab.
55 (11) (2015)