Kazuya Matsuzawa

Publication Activity (10 Years)

Years Active: 2002-2015
Publications (10 Years): 0

Top Topics

Prediction Accuracy

Fiber Bragg Grating

Scanning Devices

Top Venues

Microelectron. Reliab.

IEICE Trans. Electron.

Publications

Yuichiro Mitani, Kazuya Matsuzawa
Simple technique for prediction of breakdown voltage of ultrathin gate insulator under ESD testing. ICICDT (2015)
Li Zhang, Mitsuo Koike, Mizuki Ono, Shogo Itai, Kazuya Matsuzawa, Syotaro Ono, Wataru Saito, Masakazu Yamaguchi, Yohei Hayase, Keiryo Hara
Comprehensive 2D-carrier profiling of low-doping region by high-sensitivity scanning spreading resistance microscopy (SSRM) for power device applications. Microelectron. Reliab. 55 (9-10) (2015)
Chenyue Ma, Hans Jürgen Mattausch, Masataka Miyake, Takahiro Iizuka, Kazuya Matsuzawa, Seiichiro Yamaguchi, Teruhiko Hoshida, Akinori Kinoshita, Takahiko Arakawa, Jin He, Mitiko Miura-Mattausch
Modeling of NBTI Stress Induced Hole-Trapping and Interface-State-Generation Mechanisms under a Wide Range of Bias Conditions. IEICE Trans. Electron. (10) (2013)
Yuichiro Mitani, Shigeto Fukatsu, Daisuke Hagishima, Kazuya Matsuzawa
Lifetime prediction of channel hot carrier degradation in pMOSFETs separating NBTI component. ICICDT (2012)
Masataka Miyake, Daisuke Hori, Norio Sadachika, Uwe Feldmann, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Takahiro Iizuka, Kazuya Matsuzawa, Yasuyuki Sahara, Teruhiko Hoshida, Toshiro Tsukada
Non-Quasi-Static Carrier Dynamics of MOSFETs under Low-Voltage Operation. IEICE Trans. Electron. (5) (2009)
Nobuyuki Sano, Kazuya Matsuzawa, Mikio Mukai, Noriaki Nakayama
On discrete random dopant modeling in drift-diffusion simulations: physical meaning of 'atomistic' dopants. Microelectron. Reliab. 42 (2) (2002)