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Lifetime prediction of channel hot carrier degradation in pMOSFETs separating NBTI component.
Yuichiro Mitani
Shigeto Fukatsu
Daisuke Hagishima
Kazuya Matsuzawa
Published in:
ICICDT (2012)
Keyphrases
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prediction accuracy
prediction model
prediction algorithm
neural network
image sequences
prediction error
real time
data sets
multiscale
energy consumption
short term
routing protocol
software components