Joseph B. Bernstein

ORCID

Publication Activity (10 Years)

Years Active: 1998-2023
Publications (10 Years): 5

Top Venues

Microelectron. Reliab.

IRPS

Sensors

Massachusetts Institute of Technology, Cambridge, MA, USA (PHD)

Education History

Massachusetts Institute of Technology, Cambridge, MA, USA

PHD

Publications

Emmanuel Bender, Joseph B. Bernstein, Duane S. Boning
The Effects of Process Variations and BTI in Packaged FinFET Devices. IRPS (2023)
Joseph B. Bernstein, Emmanuel Bender, Alain Bensoussan
The Correct Hot Carrier Degradation Model. IRPS (2023)
Emmanuel Bender, Joseph B. Bernstein
Microchip Health Monitoring System Using the FLL Circuit. Sensors 21 (7) (2021)
Gady Golan, Moshe Azoulay, Tsuriel Avraham, Ilan Kremenetsky, Joseph B. Bernstein
An improved reliability model for Si and GaN power FET. Microelectron. Reliab. 81 (2018)
Joseph B. Bernstein, Alain Bensoussan, Emmanuel Bender
Reliability prediction with MTOL. Microelectron. Reliab. 68 (2017)
Joseph B. Bernstein, Moti Gabbay, Ofir Delly
Reliability matrix solution to multiple mechanism prediction. Microelectron. Reliab. 54 (12) (2014)
Bing Huang, Manuel Rodríguez, Ming Li, Joseph B. Bernstein, Carol S. Smidts
Hardware Error Likelihood Induced by the Operation of Software. IEEE Trans. Reliab. 60 (3) (2011)
Liyu Yang, Joseph B. Bernstein
Failure rate estimation of known failure mechanisms of electronic packages. Microelectron. Reliab. 49 (12) (2009)
Liyu Yang, Joseph B. Bernstein, T. Koschmieder
Assessment of acceleration models used for BGA solder joint reliability studies. Microelectron. Reliab. 49 (12) (2009)
Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor
Electronic circuit reliability modeling. Microelectron. Reliab. 46 (12) (2006)
Bing Huang, Xiaojun Li, Ming Li, Joseph B. Bernstein, Carol S. Smidts
Study of the Impact of Hardware Fault on Software Reliability. ISSRE (2005)
Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein
Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature. ISQED (2005)
John S. Suehle, Baozhong Zhu, Yuan Chen, Joseph B. Bernstein
Detailed study and projection of hard breakdown evolution in ultra-thin gate oxides. Microelectron. Reliab. 45 (3-4) (2005)
Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein
Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. ISQED (2005)
Hu Huang, Joseph B. Bernstein, Martin Peckerar, Ji Luo
Combined Channel Segmentation and Buffer Insertion for Routability and Performance Improvement of Field. ICCD (2004)
Ji Luo, Joseph B. Bernstein, J. Ari Tuchman, Hu Huang, Kuan-Jung Chung, Anthony L. Wilson
A High Performance Radiation-Hard Field Programmable Analog Array . ISQED (2004)
Zhuo Gao, Ji Luo, Hu Huang, Wei Zhang, Joseph B. Bernstein
Reliable Laser Programmable Gate Array Technology. ISQED (2002)
Joseph B. Bernstein, Wei Zhang, Carl H. Nicholas
Laser formed connections for programmable wiring. CICC (1998)

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Publication Activity (10 Years)

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Joseph B. Bernstein