Emmanuel Bender

Publication Activity (10 Years)

Years Active: 2017-2023
Publications (10 Years): 4

Top Topics

Virtual Instrument

Health Monitoring

Top Venues

Microelectron. Reliab.

Publications

Emmanuel Bender, Joseph B. Bernstein, Duane S. Boning
The Effects of Process Variations and BTI in Packaged FinFET Devices. IRPS (2023)
Joseph B. Bernstein, Emmanuel Bender, Alain Bensoussan
The Correct Hot Carrier Degradation Model. IRPS (2023)
Emmanuel Bender, Joseph B. Bernstein
Microchip Health Monitoring System Using the FLL Circuit. Sensors 21 (7) (2021)
Joseph B. Bernstein, Alain Bensoussan, Emmanuel Bender
Reliability prediction with MTOL. Microelectron. Reliab. 68 (2017)