The Correct Hot Carrier Degradation Model.
Joseph B. BernsteinEmmanuel BenderAlain BensoussanPublished in: IRPS (2023)
Keyphrases
- computational model
- mathematical model
- data sets
- statistical model
- formal model
- data structure
- probabilistic model
- management system
- sensitivity analysis
- high level
- real time
- process model
- autoregressive
- linear model
- classification models
- conceptual model
- experimental data
- data mining
- regression model
- decision making
- probability distribution
- data model
- evolutionary algorithm
- bayesian networks