Gady Golan

Publication Activity (10 Years)

Years Active: 2001-2018
Publications (10 Years): 1

Top Topics

Computational Power

Detecting Anomalies

Top Venues

Microelectron. Reliab.

Publications

Gady Golan, Moshe Azoulay, Tsuriel Avraham, Ilan Kremenetsky, Joseph B. Bernstein
An improved reliability model for Si and GaN power FET. Microelectron. Reliab. 81 (2018)
Yuval Beck, Nezah Calamero, Liran Katzir, Gady Golan
Diagnostics capabilities of various electrical anomalies in Smart Grids. ISGT Europe (2013)
Alex Axelevitch, B. Gorenstein, Gady Golan
thin films. Microelectron. Reliab. 51 (12) (2011)
Alex Axelevitch, Gady Golan
Novel silicon high sensitive photonic sensor. Microelectron. J. 40 (3) (2009)
S. Eliahou-Niv, R. Dahan, Gady Golan
Design and analysis of a novel tunable optical filter. Microelectron. J. 37 (4) (2006)
Gady Golan, Alex Axelevitch, B. Gorenstein
Si-C multilayer quasi crystals preparation by DC magnetron sputtering. Microelectron. J. 37 (12) (2006)
Gady Golan, Alex Axelevitch
Progress in vacuum photothermal processing (VPP). Microelectron. J. 37 (5) (2006)
Gady Golan, Alex Axelevitch, B. Gorenstein, V. Manevych
Hot-Probe method for evaluation of impurities concentration in semiconductors. Microelectron. J. 37 (9) (2006)
Yefim Berkovich, Gady Golan
Electric Models of Large-Scale Systems and their Analogy to Thermodynamic Systems. J. Circuits Syst. Comput. 15 (4) (2006)
Gady Golan, Alex Axelevitch, B. Sigalov, B. Gorenstein
Metal-insulator phase transition in vanadium oxides films. Microelectron. J. 34 (4) (2003)
Gady Golan, Alex Axelevitch, B. Sigalov, B. Gorenstein
Integrated thin film heater-thermocouple systems. Microelectron. Reliab. 43 (3) (2003)
Gady Golan, E. Rabinovich, A. Inberg, Alex Axelevitch, Gennady Lubarsky, P. G. Rancoita, M. Demarchi, A. Seidman, N. Croitoru
Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors. Microelectron. Reliab. 41 (1) (2001)
Gady Golan, Alex Axelevitch, E. Rabinovitch
Effects of electron beam generated in vacuum photo-thermal processing on metal-silicon contacts. Microelectron. Reliab. 41 (6) (2001)