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Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors.
Gady Golan
E. Rabinovich
A. Inberg
Alex Axelevitch
Gennady Lubarsky
P. G. Rancoita
M. Demarchi
A. Seidman
N. Croitoru
Published in:
Microelectron. Reliab. (2001)
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