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An improved reliability model for Si and GaN power FET.
Gady Golan
Moshe Azoulay
Tsuriel Avraham
Ilan Kremenetsky
Joseph B. Bernstein
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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probabilistic model
high level
theoretical framework
statistical model
computational model
objective function
management system
data sets
input image
software reliability
formal model
simulation model
power consumption
process model
multiscale
case study
information retrieval