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Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE.
Xiaojun Li
Bing Huang
J. Qin
X. Zhang
Michael Talmor
Z. Gur
Joseph B. Bernstein
Published in:
ISQED (2005)
Keyphrases
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integrated circuit
electron beam
vlsi circuits
reliability assessment
metal oxide semiconductor
low cost
high speed
real time
computer vision
image sequences
video data
mathematical model
low power
design parameters
printed circuit boards
analog vlsi