Xiaojun Li

Publication Activity (10 Years)

Years Active: 2005-2006
Publications (10 Years): 0

Publications

Joseph B. Bernstein, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor
Electronic circuit reliability modeling. Microelectron. Reliab. 46 (12) (2006)
Bing Huang, Xiaojun Li, Ming Li, Joseph B. Bernstein, Carol S. Smidts
Study of the Impact of Hardware Fault on Software Reliability. ISSRE (2005)
Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein
Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature. ISQED (2005)
Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein
Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. ISQED (2005)