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Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature.

Xiaojun LiJoerg D. WalterJoseph B. Bernstein
Published in: ISQED (2005)
Keyphrases
  • electric field
  • room temperature
  • thin film
  • power system
  • operating conditions
  • field effect transistors
  • high voltage
  • solar radiation