John S. Suehle

Publication Activity (10 Years)

Years Active: 2002-2005
Publications (10 Years): 0

Publications

John S. Suehle, Baozhong Zhu, Yuan Chen, Joseph B. Bernstein
Detailed study and projection of hard breakdown evolution in ultra-thin gate oxides. Microelectron. Reliab. 45 (3-4) (2005)
John S. Suehle
Ultra-thin Gate Oxide Reliability and Implications for Design (Tutorial Abstract). ISQED (2002)