Jonathon E. Colburn

Publication Activity (10 Years)

Years Active: 1999-2019
Publications (10 Years): 5

Top Topics

Power Reduction

Issues And Trends

Text Compression

Top Venues

Publications

Seyed Nima Mozaffari, Bonita Bhaskaran, Kaushik Narayanun, Ayub Abdollahian, Vinod Pagalone, Shantanu Sarangi, Jonathon E. Colburn
An Efficient Supervised Learning Method to Predict Power Supply Noise During At-speed Test. ITC (2019)
Peter Wohl, John A. Waicukauski, Gregory A. Maston, Jonathon E. Colburn
XLBIST: X-Tolerant Logic BIST. ITC (2018)
Zipeng Li, Jonathon E. Colburn, Vinod Pagalone, Kaushik Narayanun, Krishnendu Chakrabarty
Test-cost optimization in a scan-compression architecture using support-vector regression. VTS (2017)
Milind Sonawane, Pavan Kumar Datla Jagannadha, Sailendra Chadalavada, Shantanu Sarangi, Mahmut Yilmaz, Amit Sanghani, Karthikeyan Natarajan, Jonathon E. Colburn, Anubhav Sinha
Dynamic docking architecture for concurrent testing and peak power reduction. VTS (2016)
Milind Sonawane, Sailendra Chadalavada, Shantanu Sarangi, Amit Sanghani, Mahmut Yilmaz, Pavan Kumar Datla Jagannadha, Jonathon E. Colburn
Flexible scan interface architecture for complex SoCs. VTS (2016)
Peter Wohl, John A. Waicukauski, Jonathon E. Colburn, Milind Sonawane
Achieving extreme scan compression for SoC Designs. ITC (2014)
P. Pant, M. Amodeo, S. Vora, Jonathon E. Colburn
Innovative practices session 10C: Delay test. VTS (2013)
Peter Wohl, John A. Waicukauski, Frederic Neuveux, Gregory A. Maston, Nadir Achouri, Jonathon E. Colburn
Two-level compression through selective reseeding. ITC (2013)
Jonathon E. Colburn, K.-Y. Chung, Haluk Konuk, Y. Dong
Innovative practices session 6C: Latest practices in test compression. VTS (2013)
Peter Wohl, John A. Waicukauski, Jonathon E. Colburn
Enhancing testability by structured partial scan. VTS (2012)
Peter Wohl, John A. Waicukauski, Frederic Neuveux, Jonathon E. Colburn
Hybrid selector for high-X scan compression. ITC (2012)
Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri
Optimizing Memory Tests by Analyzing Defect Coverage. MTDT (2000)
David B. Lavo, Tracy Larrabee, Jonathon E. Colburn
Eliminating the Ouija board: automatic thresholds and probabilistic I_DDQ diagnosis. ITC (1999)
Julie D. Segal, Sergei Bakarian, Jonathon E. Colburn, Madan Kumar, Chang Hong, Alex Shubat
Determining Redundancy Requirements for Memory Arrays with Critical Area Analysis. MTDT (1999)