Optimizing Memory Tests by Analyzing Defect Coverage.
Alvin JeeJonathon E. ColburnV. Swamy IrrinkiMukesh PuriPublished in: MTDT (2000)
Keyphrases
- test suite
- computing power
- defect detection
- test cases
- databases
- past experience
- random access
- memory requirements
- data streams
- feature extraction
- expert systems
- mobile robot
- information processing
- optimal solution
- associative memory
- computational power
- decision making
- genetic algorithm
- data mining
- real time
- memory size
- information redundancy