Alvin Jee

Publication Activity (10 Years)

Years Active: 1993-2002
Publications (10 Years): 0

Publications

Alvin Jee
Defect-Oriented Analysis of Memory BIST Tests. MTDT (2002)
Mark Craig, Alvin Jee, Prashant Maniar
An Integrated Approach to Yield Loss Characterization. ITC (2002)
Alvin Jee
Defect-Oriented Analysis of Memory BIST Tests. IOLTW (2002)
Julie Segal, Alvin Jee, David Y. Lepejian, Ben Chu
Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. IEEE Des. Test Comput. 18 (3) (2001)
Alvin Jee, Jonathon E. Colburn, V. Swamy Irrinki, Mukesh Puri
Optimizing Memory Tests by Analyzing Defect Coverage. MTDT (2000)
Alvin Jee, F. Joel Ferguson
A methodolgy for characterizing cell testability. VTS (1997)
Alvin Jee, F. Joel Ferguson
Carafe: an inductive fault analysis tool for CMOS VLSI circuits. VTS (1993)