Using Electrical Bitmap Results from Embedded Memory to Enhance Yield.

Julie Segal Alvin Jee David Y. Lepejian Ben Chu

Published in: IEEE Des. Test Comput. (2001)

Keyphrases

low memory
embedded systems
memory size
memory requirements
computing power
memory space
transmission line
dynamic random access memory
case based reasoning
data structure
random access
image sequences
limited memory
memory usage
power distribution
computer engineering
electrical activity
electro mechanical