Hans-Joachim Schulze

Publication Activity (10 Years)

Years Active: 2001-2018
Publications (10 Years): 1

Top Topics

High Efficiency

Computational Efficiency

Top Venues

IET Circuits Devices Syst.

Microelectron. Reliab.

Publications

Roman Baburske, Franz-Josef Niedernostheide, Hans-Joachim Schulze, Riteshkumar Bhojani, J. Kowalsky, Josef Lutz
Unified view on energy and electrical failure of the short-circuit operation of IGBTs. Microelectron. Reliab. (2018)
Thomas Basler, M. Pfaffenlehner, Hans Peter Felsl, Franz-Josef Niedernostheide, F. Pfirsch, Hans-Joachim Schulze, Roman Baburske, Josef Lutz
Switching ruggedness and surge-current capability of diodes using the self-adjusting p emitter efficiency diode concept. IET Circuits Devices Syst. 8 (3) (2014)
Birk Heinze, Josef Lutz, Hans Peter Felsl, Hans-Joachim Schulze
Ruggedness analysis of 3.3 kV high voltage diodes considering various buffer structures and edge terminations. Microelectron. J. 39 (6) (2008)
Franz-Josef Niedernostheide, Hans-Joachim Schulze, Hans Peter Felsl, Thomas Laska, Ulrich Kellner-Werdehausen, Josef Lutz
Thyristors and IGBTs with integrated self-protection functions. IET Circuits Devices Syst. 1 (5) (2007)
Ralf Siemieniec, Hans-Joachim Schulze, Franz-Josef Niedernostheide, W. Südkamp, Josef Lutz
Compensation and doping effects in heavily helium-radiated silicon for power device applications. Microelectron. J. 37 (3) (2006)
Gerald Sölkner, Winfried Kaindl, Hans-Joachim Schulze, Gerhard K. M. Wachutka
Reliability of power electronic devices against cosmic radiation-induced failure. Microelectron. Reliab. 44 (9-11) (2004)
M. Zmeck, J. C. H. Phang, Andrew Bettiol, T. Osipowicz, F. Watt, L. J. Balk, Franz-Josef Niedernostheide, Hans-Joachim Schulze, E. Falck, R. Barthelmess
Analysis of high-power devices using proton beam induced charge microscopy. Microelectron. Reliab. 41 (9-10) (2001)
Mathias Bode, O. Freyd, Joern Fischer, Franz-Josef Niedernostheide, Hans-Joachim Schulze
Hybrid hardware for a highly parallel search in the context of learning classifiers. Artif. Intell. 130 (1) (2001)